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技术文章详细
测试硬件单板高速电路的实验室 |
| 阅读次数：3891 发布时间：2019/8/31 11:08:59 |
哪里可以测试硬件单板高速电路一致性测试？ 信任与托付 信任和托付是一体，因为信任才敢于托付。深圳***科技有限公司通过网上搜索找到我们Misenbo实验室，然后安排技术员对我们的实验室进行考核衡量，*后决定把产品交付给我们测试。从开始交流到测试完成，一共5天时间，我们用专业的服务回报客户的信任和托付，达到携手共赢。
测试介绍 这次测试主要包括单板的USB2.0眼图测试分析和MIPI信号眼图分析。 MIPI测试 Configuration | | | Oscilloscope Version | | 5.3.5 Build 22 | | | | DPOJET Version | | 5.0.0 Build 180 | | | Measurement Configuration
| | | | | Index | Measurement | Source(s) | Others | | | 1 | Height1 | Ch1 | Bit Config => Bit Type: All Bits | Clock Recovery => Method: Constant Clock – Mean, Auto Calc: Every Acq, Nominal Data Rate: Off, Bit Rate: 2.5Gb/s, Known Data Pattern: Off, Pattern Filename: C:\Users\Public\Tektronix\Tekapplications\DPOJET\Patterns\PRBS127.txt | General => Measurement Range Limits: Off, Max: 500mV, Min: 50mV, Custom Source Name: －－ | | | 2 | Width1 | Ch1 | Clock Recovery => Method: Constant Clock – Mean, Auto Calc: Every Acq, Nominal Data Rate: Off, Bit Rate: 2.5Gb/s, Known Data Pattern: Off, Pattern Filename: C:\Users\Public\Tektronix\Tekapplications\DPOJET\Patterns\PRBS127.txt | General => Measurement Range Limits: Off, Max: 1ns, Min: 50ps, Custom Source Name: －－ | | | | Source Reference Levels
| | | | | Source | Autoset Method | Rise High | Rise Mid | Rise Low | Hysteresis | Fall High | Fall Mid | Fall Low | | | Ch1 | Auto(Low-High(full wfm)) | 176.4mV | 1.68mV | -173.04mV | 13.104mV | 176.4mV | 1.68mV | -173.04mV | | | Ch2 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Ch3 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Ch4 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Math1 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Math2 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Math3 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Math4 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Ref1 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Ref2 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Ref3 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | Ref4 | Auto | 1V | 0V | -1V | 30mV | 1V | 0V | -1V | | | | Miscellaneous Settings
| | | | | | Source Gating | Source Qualify | Stat Population Limit | | | State | Off | Off, Active: High | Off, Limit By: Acquistions, Stop Condition: Each Measurement | | | Source | －－ | Ch4 | －－ | | | Size | －－ | －－ | 1k | |
Measurement Results
| | | Description | Mean | Std Dev | Max | Min | p-p | Population | Max-cc | Min-cc | | | | Height1, Ch1 | 210.15mV | 0.0000V | 210.15mV | 210.15mV | 0.0000V | 1 | 0.0000V | 0.0000V | | | | Current Acquisition | 210.15mV | 0.0000V | 210.15mV | 210.15mV | 0.0000V | 1 | 0.0000V | 0.0000V | | | | Width1, Ch1 | 2.3939ns | 0.0000s | 2.3939ns | 2.3939ns | 0.0000s | 1 | 0.0000s | 0.0000s | | | | Current Acquisition | 2.3939ns | 0.0000s | 2.3939ns | 2.3939ns | 0.0000s | 1 | 0.0000s | 0.0000s |
Pass/Fail Summary No pass/fail limits are currently selected.
Plot Images
| | Measurement Plot(s) | | | | Oscilloscope Waveform | | | 
| USB2.0测试 Waveform Plot Eye Diagram
测试报告及客户评价
客户评价
可提供的代测项目介绍
高速电路测试 射频电路测试 原创作者：北京淼森波信息技术有限公司 |
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